業績
2003
Masashi Ishii and Takayuki Uchihashi, "X-ray absorption measurement by scanning capacitance microscopy", Physica B Condens. Matter 340-342, 1142-1146 (2003). DOI: 10.1016/j.physb.2003.09.098.
Toshio Ando, Takayuki Uchihashi, Noriyuki Kodera, Atsushi Miyagi, Ryo Nakakita, Hayato Yamashita, and Mitsuru Sakashita, "High-speed atomic force microscopy for studying the dynamic behavior of protein molecules at work", Jpn. J. Appl. Phys. 45(3B), 1897-1903 (2006). DOI: 10.1143/JJAP.45.1897.
Takayuki Uchihashi, Noriyuki Kodera, Hisanori Itoh, Hayato Yamashita, and Toshio Ando, "Feed-forward control for high-speed AFM imaging of biomolecules", Jpn. J. Appl. Phys. 45(3B), 1904-1908 (2006). DOI: 10.1143/JJAP.45.1904
2002
Haruhiko Yoshida, Toshinori Takami, Takayuki Uchihashi, Seigo Kishino, Hideki Naruoka, and Yoji Mashiko, "Preliminary study of a novel scanning charge-pumping method using extra gates for SOI wafer inspection", IEEE Electron Device Lett. 23, 630-632 (2002). DOI: 10.1109/LED.2002.803750.
Yoshimori Ishizuka, Takayuki Uchihashi, Haruhiko Yoshida, and Seigo Kishino, "Local electrical characterization of SOI wafers by scanning probe microscopy", Mater. Sci. Eng. B 91-92, 156-159 (2002). DOI: 10.1016/S0921-5107(01)00983-7.
Haruhiko Yoshida, Hiroshi Sasakura, Tomoyuki Yabuuchi, Toshinori Takami, Takayuki Uchihashi, and Seigo Kishino, "Back-channel-type scanning charge pumping method for characterization of interface traps in silicon-on-insulator wafer", Appl. Phys. Lett. 79, 1825-1827 (2001). DOI: 10.1103/PhysRevB.72.125430.
2001
Haruhiko Yoshida, Hiroshi Sasakura, Tomoyuki Yabuuchi, Toshinori Takami, Takayuki Uchihashi, and Seigo Kishino, "Back-channel-type scanning charge pumping method for characterization of interface traps in silicon-on-insulator wafer", Appl. Phys. Lett. 79, 1825-1827 (2001). DOI: 10.1063/1.1399311.
Masaharu Komiyama, Takayuki Uchihashi, Yasuhiro Sugawara, and Seizo Morita, "Molecular orbital interpretation of thymine/graphite nc-AFM images", Surf. Interface Anal. 32, 53-56 (2001). DOI: 10.1002/sia.1004.
Wataru Mizutani, Takao Ishida, Nami Choi, Takayuki Uchihashi, and H Tokumoto, "Electric-dipole layer on Au (111) surfaces", Appl. Phys. A 72(2), S181-S184 (2001). DOI: 10.1007/s003390100675.
Suzanne P. Jarvis, Takao Ishida, Takayuki Uchihashi, Yoshikazu Nakayama, and Hiroshi Tokumoto, "Frequency modulation detection atomic force microscopy in the liquid environment", Appl. Phys. A 72(1), S129-S132 (2001). DOI: 10.1007/s003390100647.
Kazuo Umemura, Jun Komatsu, Takayuki Uchihashi, Nami Choi, Shukuko Ikawa, Taro Nishinaka, Takehiko Shibata, Yoshikazu Nakayama, Shinji Katsura, Akira Mizuno, Hiroshi Tokumoto, Mitsuru Ishikawa, and Reiko Kuroda, "Atomic force microscopy of RecA–DNA complexes using a carbon nanotube tip", Biochem. Biophys. Res. Commun. 281(2), 390-395 (2001). DOI: 10.1006/bbrc.2001.4333.
Wataru Mizutani, Nami Choi, Takayuki Uchihashi, and Hiroshi Tokumoto, "Carbon Nanotube Tip for Scanning Tunneling Microscope", Jpn. J. Appl. Phys. 40, 4328 (2001). DOI: 10.1143/JJAP.40.4328.
2000
Takayuki Uchihashi, Nami Choi, Masato Tanigawa, Makoto Ashino, Yasuhiro Sugawara, Hidehiro Nishijima, Seiji Akita, Yoshikazu Nakayama, Hiroshi Tokumoto, Kousuke Yokoyama, Seizo Morita, and Mitsuru Ishikawa, "Carbon-Nanotube Tip for Highly-Reproducible Imaging of Deoxyribonucleic Acid Helical Turns by Noncontact Atomic Force Microscopy", Jpn. J. Appl. Phys. 39, L887 (2000). DOI: 10.1143/JJAP.39.L887.
Suzanne P Jarvis, Takayuki Uchihashi, Takao Ishida, Hiroshi Tokumoto, and Yoshikazu Nakayama, "Local Solvation Shell Measurement in Water Using a Carbon Nanotube Probe", Phys. Chem. B 104, 6091-6094 (2000). DOI: 10.1021/jp001616d.
Makoto Ashino, Takayuki Uchihashi, Kousuke Yokoyama, Yasuhiro Sugawara, Seizo Morita, and Mitsuru Ishikawa, "Structures of an Oxygen-Deficient TiO2(110) Surface Studied by Noncontact Atomic Force Microscopy", Jpn. J. Appl. Phys. 39, 3765 (2001). DOI: 10.1143/JJAP.39.3765.
Seizo Morita, Yasuhiro Sugawara, Kousuke Yokoyama, and Takayuki Uchihashi, "Correlation of frequency shift discontinuity to atomic positions on a Si(111)7 × 7 surface by noncontact atomic force microscopy", Nanotechnology 11, 120-123 (2000). DOI: 10.1088/0957-4484/11/2/313.
Nami Choi, Takayuki Uchihashi, Hidehiro Nishijima, Takao Ishida, Wataru Mizutani, Seiji Akita, Yoshikazu Nakayama, Mitsuru Ishikawa, and Hiroshi Tokumoto, "Atomic Force Microscopy of Single-Walled Carbon Nanotubes Using Carbon Nanotube Tip", Jpn. J. Appl. Phys. 39, 3707-3710 (2000). DOI: 10.1143/JJAP.39.3707.
Makoto Ashino, Takayuki Uchihashi, Kousuke Yokoyama, Yasuhiro Sugawara, Seizo Morita, and Mitsuru Ishikawa, "STM and atomic-resolution noncontact AFM of an oxygen-deficient TiO2(110) surface", Phys. Rev. B 61, 13955-13959 (2000). DOI: 10.1103/PhysRevB.61.13955.
Makoto Ashino, Takayuki Uchihashi, Kousuke Yokoyama, Yasuhiro Sugawara, Seizo Morita, and Mitsuru Ishikawa, "Atomic-scale structures on a non-stoichiometric TiO2(110) surface studied by noncontact AFM", Appl. Surf. Sci. 157, 212-217 (2000). DOI: 10.1016/S0169-4332(99)00528-0.
Takayuki Uchihashi, Takao Ishida, Masaharu Komiyama, Makoto Ashino, Yasuhiro Sugawara, Wataru Mizutani, Kousuke Yokoyama, Seizo Morita, Hiroshi Tokumoto, and Mitsuru Ishikawa, "High-resolution imaging of organic monolayers using noncontact AFM", Appl. Surf. Sci. 157, 244-250 (2000). DOI: 10.1016/S0169-4332(99)00534-6.
Takayuki Uchihashi, Masato Tanigawa, Makoto Ashino, Yasuhiro Sugawara, Kousuke Yokoyama, Seizo Morita, and Mitsuru Ishikawa "Identification of B-form DNA in an ultrahigh vacuum by noncontact-mode atomic force microscopy", Langmuir 16, 1349-1353 (2000). DOI: 10.1021/la991025i.
Kousuke Yokoyama, Taketoshi Ochi, Takayuki Uchihashi, Makoto Ashino, Yasuhiro Sugawara, Nobuhito Suehira, and Seizo Morita "Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism", Rev. Sci. Instrum. 71, 128-132 (2000). DOI: 10.1063/1.1150174.
1999
Seizo Morita, Yasuhiro Sugawara, Shigeki Orisaka, and Takayuki Uchihashi, "Missing Ag Atom on Si (111)√ 3×√ 3–Ag Surface Observed by Noncontact Atomic Force Microscopy", Jpn. J. Appl. Phys. 38, L1342-L1344 (1999). DOI: 10.1143/JJAP.38.L1342.
Takayuki Uchihashi, Takao Okada, Yasuhiro Sugawara, Kousuke Yokoyama, Seizo Morita, "Self-assembled monolayer of adenine base on graphite studied by noncontact atomic force microscopy", Phys. Rev. B 60, 8309-8313 (1999). DOI: 10.1103/PhysRevB.60.8309.
Yasuhiro Sugawara, Tetsuya Minobe, Shigeki Orisaka, Takayuki Uchihashi, Takahiro Tsukamoto, and Seizo Morita, "Non‐contact AFM images measured on Si (111)√ 3×√ 3‐Ag and Ag (111) surfaces", Sur. Interface Anal. 27, 456-461 (1999). DOI: 10.1002/(SICI)1096-9918(199905/06)27:5/6 <456::AID-SIA536 ≷3.0.CO;2-I.
Takayuki Uchihashi, Yasuhiro Sugawara, Takahiro Tsukamoto, Tetsuya Minobe, Shigeki Orisaka, Takao Okada, and Seizo Morita, "Imaging of chemical reactivity and buckled dimers on Si (100) 2× 1 reconstructed surface with noncontact AFM", Appl. Sur. Sci. 140, 304-308 (1999). DOI: 10.1016/S0169-4332(98)00545-5.
Tetsuya Minobe, Takayuki Uchihashi, Takahiro Tsukamoto, Shigeki Orisaka, Yasuhiro Sugawara, and Seizo Morita, "Distance dependence of noncontact-AFM image contrast on Si (111) 3× 3–Ag structure", Appl. Sur. Sci. 140, 298-303 (1999). DOI: 10.1016/S0169-4332(98)00544-3.
Yasuhiro Sugawara, Takayuki Uchihashi, Masayuki Abe, and Seizo Morita, "True atomic resolution imaging of surface structure and surface charge on the GaAs (110)", Appl. Sur. Sci. 140, 371-375 (1999). DOI: 10.1016/S0169-4332(98)00557-1.
Shigeki Orisaka, Tetsuya Minobe, Takayuki Uchihashi, Yasuhiro Sugawara, and Seizo Morita, "The atomic resolution imaging of metallic Ag (111) surface by noncontact atomic force microscope", Appl. Sur. Sci. 140, 243-246 (1999). DOI: 10.1016/S0169-4332(98)00534-0.